- Integrated Circuits
- FX362: Instrument Analog Front End: TDR + 30G S&H
FX362: Instrument Analog Front End: TDR + 30G S&H
The FX362 is an Analog Front End (AFE) integrated circuit for differential time-domain reflectometry. The FX362 integrates two high-speed test and measurement functional blocks: i) a controlled-amplitude differential voltage step generator – the Time Domain Reflectometer (TDR) stimulus, and; ii) a differential, dual-rank, sample-and-hold – to allow digitization of the reflected voltage step that is indicative of an impedance discontinuity. With the step-generator disabled, the sample and hold amplifier (S&HA) acts as a Digital Sampling Oscilloscope (DSO) AFE, facilitating sampling of 28Gb/s NRZ or 28G symbol-rate PAM4 eyes. The FX362 is a compact, test-instrument-on-a chip IC delivering capability not previously integrated.