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FX364 TDR/S&H

 The FX364 is a instrumentation Analog Front End (AFE) integrated circuit (IC) is designed to enable 100ohm single-ended time-domain impedance and transmission measurements via time-domain reflectometry.  By monolithically integrating a single-ended 50Ω 10ps rise-time step generator with an ultra-fast 30GHz Sample and Hold Amplifier, the FX364 enables a class of time-domain reflectance, time-domain transmission, S11, S21, NEXT and FEXT characterization. 

Specifications

  • Monolithic Analog Front End IC:  50Ω TDR step-stimulus + Sample & Hold
  • Allows TDR, TDT, S11, S21, NEXT, FEXT testing
  • 10ps rise time; allows return loss (S11) and insertion loss (S21) measurement
  • Sample & Hold allows digitization to 30GHz
  • Step stimulus: adjustable amplitude 100m-500mVpp, under analog control
  • Internally set to 50Ω +/- 0.5Ω
  • S&H: 30GHz analog bandwidth, 10-200MSa/s
  • Low power dissipation, 600mW
  • 2.9x2.9mm ceramic air-cavity QFN16 package
  • On-chip bandgap and current references
  • -5V Vee supply voltage
  • Vddo for S&H common-mode ADC output match
  • Inputs differential 50 ohm, DC-coupled

Application

  • Board, connector, cable interconnect analysis
  • Manufacture/end-user cable assembly testing
  • Allows impedance characterization, to 5m
  • IC/system Automated Test Equipment (ATE)
  • Handheld test & measurement
  • Communications Systems/Backplane test

​Data Sheet and High Speed Evaluation Board Available, please visit our Contact page for more information

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  • Home
  • Products
    • FX331A S&H
    • FX362 TDR/S&H
    • FX364 TDR/S&H
    • FX333 S&H
  • Services
  • Intellectual Property
    • Patents
    • Dual Band 25.78125G/28Gbps SerDes/CDR
  • About
  • Careers
  • Contact