FX364 TDR/S&H

 The FX364 is a instrumentation Analog Front End (AFE) integrated circuit (IC) is designed to enable 100ohm single-ended time-domain impedance and transmission measurements via time-domain reflectometry.  By monolithically integrating a single-ended 50Ω 10ps rise-time step generator with an ultra-fast 30GHz Sample and Hold Amplifier, the FX364 enables a class of time-domain reflectance, time-domain transmission, S11, S21, NEXT and FEXT characterization. 

Specifications

• Monolithic Analog Front End IC:  50Ω TDR step-stimulus + Sample & Hold
• Allows TDR, TDT, S11, S21, NEXT, FEXT testing
• 10ps rise time; allows return loss (S11) and insertion loss (S21) measurement
• Sample & Hold allows digitization to 30GHz
• Step stimulus: adjustable amplitude 100m-500mVpp, under analog control
• Internally set to 50Ω +/- 0.5Ω
• S&H: 30GHz analog bandwidth, 10-200MSa/s
• Low power dissipation, 600mW
• 2.9x2.9mm ceramic air-cavity QFN16 package
• On-chip bandgap and current references
• -5V Vee supply voltage
• Vddo for S&H common-mode ADC output match
• Inputs differential 50 ohm, DC-coupled

Application

• Board, connector, cable interconnect analysis
• Manufacture/end-user cable assembly testing
• Allows impedance characterization, to 5m
• IC/system Automated Test Equipment (ATE)
• Handheld test & measurement
• Communications Systems/Backplane test

​Data Sheet and High Speed Evaluation Board Available, please visit our Contact page for more information