FX362 TDR/S&H

The FX362 is an Analog Front End (AFE) integrated circuit for differential time-domain reflectometry.  The FX362 integrates two high-speed test and measurement functional blocks:  i) a controlled-amplitude differential voltage step generator – the Time Domain Reflectometer (TDR) stimulus, and; ii) a differential, dual-rank, sample-and-hold – to allow digitization of the reflected voltage step that is indicative of an impedance discontinuity.  With the step-generator disabled, the sample and hold amplifier (S&HA) acts as a Digital Sampling Oscilloscope (DSO) AFE, facilitating sampling of 28Gb/s NRZ or 28G symbol-rate PAM4 eyes. The FX362 is a compact, test-instrument-on-a chip IC delivering capability not previously integrated.  ​

Specifications

• Instrument Analog Front End:  Differential TDR step-stimulus + differential Sample & Hold
• Differential step-generation amplitude control
• Allow precision digitization of TDR step response
• Step stimulus: 12ps rise-time, amplitude to 100-1000mVppd under analog control
• S&H: 30GHz analog bandwidth, 250Msps S&H
• Low power dissipation, 770mW
• 3x3mm ceramic air-cavity QFN16 package
• On-chip bandgap and current references
• -5V Vee  supply voltage, Vddo for output common-mode adjustment
• Externally-set S&H output common-mode
• DC-coupled Input: 100Ω diff, 50Ω to Gnd

Applications

• Time Domain Reflectometry; impedance test
• Copper board-trace, connector, cable evaluation
• IC/system Automated Test Equipment (ATE)
• Handheld test & measurement
• Communications Systems/Backplane test

Data Sheet and High Speed Evaluation Board Available, please visit our Contact page for more information