FX364: Instrument AFE: Single-Ended TDR + 30G S&H
Features
- Monolithic Analog Front End IC: 50Ω TDR step-stimulus + Sample & Hold
- Allows TDR, TDT, S11, S21, NEXT, FEXT testing
- 10ps rise time; allows return loss (S11) and insertion loss (S21) measurement
- Sample & Hold allows digitization to 30GHz
- Step stimulus: adjustable amplitude 100m-500mVpp, under analog control
- Internally set to 50Ω +/- 0.5Ω
- S&H: 30GHz analog bandwidth, 10-200MSa/s
- Low power dissipation, 600mW
- 3x3mm ceramic air-cavity QFN16 package
- On-chip bandgap and current references
- -5V Vee supply voltage
- Vddo for S&H common-mode ADC output match
- Inputs differential 50 ohm, DC-coupled
Description
The FX364 is a instrumentation Analog Front End (AFE) integrated circuit (IC) is designed to enable 100ohm single-ended time-domain impedance and transmission measurements via time-domain reflectometry. By monolithically integrating a single-ended 50Ω 10ps rise-time step generator with an ultra-fast 30GHz Sample and Hold Amplifier, the FX364 enables a class of time-domain reflectance, time-domain transmission, S11, S21, NEXT and FEXT characterization.
Applications
- Board, connector, cable interconnect analysis
- Manufacture/end-user cable assembly testing
- Allows impedance characterization, to 5m
- IC/system Automated Test Equipment (ATE)
- Handheld test & measurement
- Communications Systems/Backplane test
- Data Sheet and High Speed Evaluation Board Available Request Data Sheet, Quote or Eval Board