FX364: Instrument AFE:  Single-Ended TDR + 30G S&H

Features

  • Monolithic Analog Front End IC:  50Ω TDR step-stimulus + Sample & Hold
  • Allows TDR, TDT, S11, S21, NEXT, FEXT testing
  • 10ps rise time; allows return loss (S11) and insertion loss (S21) measurement
  • Sample & Hold allows digitization to 30GHz
  • Step stimulus: adjustable amplitude 100m-500mVpp, under analog control
  • Internally set to 50Ω +/- 0.5Ω
  • S&H: 30GHz analog bandwidth, 10-200MSa/s
  • Low power dissipation, 600mW
  • 3x3mm ceramic air-cavity QFN16 package
  • On-chip bandgap and current references
  • -5V Vee supply voltage
  • Vddo for S&H common-mode ADC output match
  • Inputs differential 50 ohm, DC-coupled

Description 

The FX364 is a instrumentation Analog Front End (AFE) integrated circuit (IC) is designed to enable 100ohm single-ended time-domain impedance and transmission measurements via time-domain reflectometry.  By monolithically integrating a single-ended 50Ω 10ps rise-time step generator with an ultra-fast 30GHz Sample and Hold Amplifier, the FX364 enables a class of time-domain reflectance, time-domain transmission, S11, S21, NEXT and FEXT characterization. 

Applications 

  • Board, connector, cable interconnect analysis
  • Manufacture/end-user cable assembly testing
  • Allows impedance characterization, to 5m
  • IC/system Automated Test Equipment (ATE)
  • Handheld test & measurement
  • Communications Systems/Backplane test